Determination of the refractive index at soft X-ray resonances
نویسندگان
چکیده
منابع مشابه
Soft-x-ray interferometer for measuring the refractive index of materials.
We have designed and built a soft-x-ray interferometer to test the possibility of a direct measurement of the refractive index (i.e., the real part of the complex index) of materials in the soft-x-ray range. The interferometer is based on the Fresnel bimirror setup. It works near the zero path difference and requires only little spatial coherence. Plane mirrors at grazing incidence are the only...
متن کاملRefractive index determination
The central focal masking ("dispersion staining") technique is convenient and effective for determining the refractive index of a microfragment by the immersion method and for distinguishing between minerals in an immersion mount. For most microscopes the only modification needed is the installation of a small opaque dot at or near the focal point of the medium power objective. White light illu...
متن کاملSoft X-ray microscopy at the NSLS
Soft X-ray microscopy at the NSLS Tobias Beetz, Michael Feser, Holger Fleckenstein, Benjamin Hornberger, Chris Jacobsen, Janos Kirz, Mirna Lerotic, Enju Lima, Ming Lu, David Sayre, David Shapiro, Aaron Stein, Don Tennant, and Sue Wirick Department of Physics & Astronomy, Stony Brook University, Stony Brook NY 11794, USA Brookhaven National Laboratory, Upton, NY 11973-5000, USA New Jersey Nanote...
متن کاملA single-image method for x-ray refractive index CT.
X-ray refraction-based computer tomography imaging is a well-established method for nondestructive investigations of various objects. In order to perform the 3D reconstruction of the index of refraction, two or more raw computed tomography phase-contrast images are usually acquired and combined to retrieve the refraction map (i.e. differential phase) signal within the sample. We suggest an appr...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Electron Spectroscopy and Related Phenomena
سال: 2004
ISSN: 0368-2048
DOI: 10.1016/j.elspec.2004.02.103